Premium
A method of correction for absorption matrix effects in samples of ‘intermediate’ thickness in EDXRF analysis
Author(s) -
Markowicz Andrzej
Publication year - 1979
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300080107
Subject(s) - matrix (chemical analysis) , absorption (acoustics) , trace (psycholinguistics) , compton scattering , x ray fluorescence , computational physics , analytical chemistry (journal) , physics , chemistry , optics , fluorescence , scattering , chromatography , linguistics , philosophy
Theoretical grounds for a method of the elimination of absorption matrix effects based upon the application of the measurement of the intensity of the coherent scattered and Compton scattered X‐rays are presented in this paper. The presented method has been confirmed experimentally. The described method of the elimination of the absorption matrix effect can be applied, in the case of samples having ‘intermediate’ masses per unit area, by means of analysis by the X‐ray fluorescence method. The total error (standard deviation) of correction for absorption obtained by the proposed method varies from 3–7% for the values of this correction from 2.5–1.3 respectively. The presented method can be used in the trace analysis of biological and environmental materials.