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A focusing X‐ray polarizer for energy‐dispersive analysis
Author(s) -
Ong Poen S.,
Randall John N.
Publication year - 1978
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300070411
Subject(s) - polarizer , optics , polarization (electrochemistry) , spectrum analyzer , diffraction , materials science , x ray , radiation , synchrotron radiation , bragg's law , physics , chemistry , birefringence
The Properties of diffracting crystals a Bragg and of near 45° are studied for use as an X‐ray polarizer. Such crystals have many advantages over the Barkla type polarizer when used in an energy‐dispersive X‐ray analyzer. The study shows that many matching λ‐d combinations are available, but the present work was done with LiF (200). With this crystal, the second order diffraction of Cu Kβ radiation occurs at 43.67° and an improvement of peak to background ratio by a factor 45 was obtained. The study revealed that a substantial improvement of peak to minimum detection limit can be obtained with a larger deviation of the polarization angle, as long as this deviation is accompanied by a higher X‐ray output.