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Measurement of K‐shell flourescence yield and Kα/Kβ intensity ratio for nickel
Author(s) -
Keith H. D.,
Loomis T. C.
Publication year - 1978
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300070409
Subject(s) - allowance (engineering) , scattering , nickel , yield (engineering) , excitation , range (aeronautics) , intensity (physics) , residual , atomic physics , electron shell , foil method , atomic number , computational physics , analytical chemistry (journal) , materials science , physics , chemistry , optics , mathematics , algorithm , quantum mechanics , thermodynamics , ion , mechanical engineering , chromatography , metallurgy , composite material , ionization , engineering
For application for the fundamental parameter approach to quantitative chemical analysis of mixtures by X‐ray fluorescence, accrate knowledge is required of fluroescence yields and ralative intensities of X‐ray lines of the various elements involved. The spread in published data suggests, however, that these parameters are not known with as much accuracy as could be used profitably. In this paper we describe a method by which K‐shell flurescence yield and Kα/Kβ intensity ratio can both be measured in the same experiment to within approximately 0.5% for pure elements available as thin polcrystalline foil. Results are given for the particular case of nickel (Z=28) for which we find ω K = 0.452 ± 0.002 and Kα/Kβ=6.91 ± 0.33 5 , but the method is readily applicable to anty element whose atomic number falls in the approximate range 20 ≲ Z ≲ 50 and which can be obtained in suitable physical form. A key factor in the experimental design is use of a non‐dispersive (intrinsic germanium) X‐ray analyzer; this makes it possible to employ a very simple transmission geometry which can be characterized quite precisely. Experimental conditions, and precautions needed to obtain accurate and consistant results, are described in some detail. Among other corrections applied, allowance is made for scattering of both exciting statistics and residual uncertaintes incalculating corrections for scattering. Among these residual uncertainties are errors in correcting scattering coefficients for anomalous dispersion. Such errors are significant only when evaluating f K , the K‐shell excitation efficienvcy; the important product f K ω K can, however, be determined ( f K ω K = 0.398 ± 0.002) with greater reliability than ω K itself.