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The direct measurement of Ga in binary PuGa alloys using X‐ray spectrometic techniques
Author(s) -
Wallace P. L.,
Homser P. K.,
Walden J. C.,
Haugen W. L.
Publication year - 1978
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300070408
Subject(s) - spectrometer , binary number , materials science , energy (signal processing) , certified reference materials , content (measure theory) , analytical chemistry (journal) , physics , optics , chemistry , mathematics , chromatography , mathematical analysis , arithmetic , quantum mechanics , detection limit
Abstract Three X‐ray spectrometric procedures have been developed to directly measure the Ga content in binary PuGa alloys. In one procedure en energy‐dispersive spectrometer is used; in the other two a wavelengh‐dispersive spectrometer is used. Certified reference alloys with known Ga content have been produced, and simple procedures to handle them safely have been developed. We have constructed an energy‐dispersive spectrometer system for analyzing Pu‐containing materials and charactrerized the low energy gamma‐ray spectrum of Pu.