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Measure of precision in the determination of concentration
Author(s) -
Kotrba Zdeněk
Publication year - 1978
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300070405
Subject(s) - measure (data warehouse) , standard deviation , mathematics , relative standard deviation , statistics , computer science , data mining , detection limit
An equation has been derived for the computaion of the standard deviation of the results of X‐ray micro analysis. The contributions of partial standard deviations of all magnitudes are included. The equation is gernerally applicable to multiple measurements and various methods of measurements.