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Electron probe microanalysis applied to very thin layers of aluminium‐nickel alloys
Author(s) -
Dužević D.,
Bonefačić A.
Publication year - 1978
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300070308
Subject(s) - microanalysis , electron probe microanalysis , aluminium , nickel , materials science , thin film , homogeneous , reinterpretation , metal , analytical chemistry (journal) , thin layers , electron microprobe , component (thermodynamics) , metallurgy , chemistry , nanotechnology , composite material , thermodynamics , physics , environmental chemistry , organic chemistry , acoustics
In order to determine the composition of very thin homogeneous layers of multi‐component systems, a reinterpretation of G. A. Hutchins' Method for elemental metal films was worked out. This made it theoritically possible to calibrate for the composition of complex n‐component fims by using massive standards of pure constituents as is done in the case of bulk samples. The method was supplied to very thin layers of AlNi alloys and the results are compared with those obtained by means of emission X‐ray spectrometry.