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A procedure to increase signal in X‐ray spectrometry
Author(s) -
Mathieson A. McL.
Publication year - 1977
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300060403
Subject(s) - asymmetry , perpendicular , yield (engineering) , signal (programming language) , crystal (programming language) , rotation (mathematics) , optics , x ray , materials science , plane (geometry) , single crystal , power (physics) , physics , chemistry , crystallography , computer science , geometry , mathematics , quantum mechanics , programming language , metallurgy
Use of an asymmetrically‐cut single crystal whose surface is polished optically flat can yield a considerable gain in signal over that available in the conventional symmetrical disposition in cases where high resolving power is not critical. Adjustment of the level of asymmetry is achieved simply by rotation of the wedgeshaped crystal about the perpendicular to the Bragg plane used.