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The absolute determination of the reflection integral of Bragg X‐ray analyser crystals. Two‐reflection methods
Author(s) -
Evans Kenton D.,
Leigh Bryan,
Lewis Margaret
Publication year - 1977
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300060306
Subject(s) - analyser , reflection (computer programming) , bragg's law , optics , materials science , x ray , total external reflection , total internal reflection , bragg peak , physics , diffraction , computer science , programming language , beam (structure)
Abstract The use of the two‐reflection system for the measurement of the reflection integral of Bragg X‐ray analyser crystals is investigated. Several procedures are developed and shown to produce results consistent with previously reported single reflection measurements. The new procedures are substantially more convenient in routine use.