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The application of a ‘curve‐fitting computer program’ to compensate for inter‐element effects in X‐ray fluorescence analysis of rock samples. The determination of vanadium in geological standards
Author(s) -
Riddle Chris,
Smith T. E.
Publication year - 1977
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300060107
Subject(s) - vanadium , curve fitting , x ray fluorescence , compensation (psychology) , titanium , element (criminal law) , interference (communication) , fluorescence , spectral line , computer program , analytical chemistry (journal) , algorithm , materials science , biological system , computer science , optics , chemistry , physics , telecommunications , psychology , channel (broadcasting) , chromatography , astronomy , law , psychoanalysis , political science , metallurgy , operating system , machine learning , biology
A computer program, used to ‘curve‐fit’ complex spectra of overlapping peaks in other spectral applications, has been used with X‐ray fluorescence data. Compensation is made for analytical error introduced through peak overlap. A typical case of this ‘inter‐element interference’, that of titanium upon vanadium, is taken to demonstrate the method. A comparison between the computer‐generated results and those determined by the conventional inter‐element correction method favours the curve‐fitting procedure.