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Quantitative X‐ray diffraction analysis by a direct calculation method
Author(s) -
Hooton D. H.,
Giorgetta N. E.
Publication year - 1977
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300060103
Subject(s) - diffraction , calibration , basis (linear algebra) , x ray crystallography , x ray , computational physics , absorption (acoustics) , quantitative analysis (chemistry) , powder diffraction , materials science , analytical chemistry (journal) , physics , optics , crystallography , chemistry , mathematics , geometry , quantum mechanics , chromatography
A new quantitative X‐ray diffraction technique has been developed by examining the theoretical basis of X‐ray diffraction originally outlined by Alexander and Klug. The new technique is based on the assumption that all components are identifiable and are to be analysed for, and avoids the use of internal standards, calibration curves, or mass absorption coefficient measurements.