Premium
The analytical description of the white spectrum from a Mo X‐ray tube
Author(s) -
Castellano E. E.,
Rivero B. E.
Publication year - 1976
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300050411
Subject(s) - tube (container) , x ray tube , x ray , exponential function , multiplication (music) , diffraction , wavelength , optics , intensity (physics) , spectrum (functional analysis) , materials science , voltage , physics , computational physics , mathematics , mathematical analysis , quantum mechanics , acoustics , electrode , composite material , anode
Kramers' formula for the white intensity distribution from a diffraction X‐ray tube is modified to obtain a better analytical description of the observed values. The correction is performed through the multiplication of an exponential factor which depends upon a conveniently defined ‘effective depth’ of X‐ray white production. This effective depth is obtained for a Mo target as a function of operating voltage (varying from 8.5‐50 kV) and wavelength (varying from 0.421–2.310 Å).