A correction method for scattered background intensity of target elements in fluorescent X‐ray spectrometry | Zendy

Murata Michihiro | Zendy

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A correction method for scattered background intensity of target elements in fluorescent X‐ray spectrometry

Author(s) -

Murata Michihiro

Publication year - 1976

Publication title -

x‐ray spectrometry

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.447

H-Index - 45

eISSN - 1097-4539

pISSN - 0049-8246

DOI - 10.1002/xrs.1300050306

Subject(s) - radiation , intensity (physics) , fluorescence , optics , radiant intensity , physics , x ray fluorescence , x ray tube , x ray , sample (material) , electrode , anode , quantum mechanics , thermodynamics

A method for correcting scattered fluorescent X‐ray radiation arising from contaminants in a target of an X‐ray tube is described. The universal correction factor was obtained by measuring the intensity ratio of a characteristic radiation of an analytical element to a background radiation on a reference standard which contains none of the analytical element. The correction was performed by subtracting the intensity ratio of the reference standard from that of a sample. The method requires no calculation of correcting factors.

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