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Evaluation of a practical background calculation method in X‐ray energy analysis
Author(s) -
van Espen P.,
Adams F.
Publication year - 1976
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300050304
Subject(s) - radiation , spectral line , excited state , radiant intensity , physics , intensity (physics) , atomic physics , optics , computational physics , astronomy
The background beneath the fluorescence lines of energy dispersive X‐ray spectra obtained with a molybdenam secondary target tube‐excited system can be obtained from the intensities of the coherently and incoherently scattered radiation. The background intensity at a particular energy is equal to the product of a proportionality factor multiplied by the incoherently scattered radiation intensity, plus another proportionality factor multiplied by the coherently scattered radiation intensity. The proportionality factors are determined from measurements of a number of molybdenum‐loaded cellulose filters. The proposed procedure provides accurate results for the analysis of complex X‐ray spectra of thin samples of varying composition.