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The atomic number dependence of the X‐ray continuum intensity and the practical calculation of background in energy dispersive electron microprobe analysis
Author(s) -
Smith D. G. W.,
Gold C. M.,
Tomlinson D. A.
Publication year - 1975
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300040311
Subject(s) - electron microprobe , atomic number , electron , effective atomic number , range (aeronautics) , atomic physics , intensity (physics) , physics , computational physics , chemistry , materials science , optics , nuclear physics , mineralogy , composite material
Computer fitting techniques have been used to derive a new expression for the relationship between X‐ray continuum intensity and atomic number for a range of electron acelerating potentials up to 25 kV, continuum energies up to 10 keV and average atomic numbers up to thirty. A practical approach to background corrections in energy dispersive electron microprobe analysis, which utilizes this expression, is outlined. The procedure should lead to significant improvements in both accuracy and detection limits in this method of X‐ray analysis.