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Application of the method of variable take‐off angle to rapid quantitative XRFA with energy dispersive systems
Author(s) -
Ebel H.,
Drabseh S.
Publication year - 1975
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300040205
Subject(s) - goniometer , analyser , optics , detector , energy (signal processing) , diffraction , variable (mathematics) , sample (material) , surface (topology) , materials science , physics , mathematical analysis , mathematics , geometry , statistics , thermodynamics
One way carrying out quantitative X‐ray fluorescence analysis with fundamental parameters is the method of variable take‐off angle. At angles nearly parallel to the sample surface, the equations can be solved more easily and no knowledge of the white spectrum and μ(λ) is needed. For practical application, in order to get a well defined geometry, we used a diffraction goniometer, an X‐ray tube with Mo target and an energy dispersive detector, followed by a multichannel analyser. After calibrating the system, all information essential for a quantitative analysis was obtained from a single measurement. The validity of the final equations was verified by experiments with different alloys, consisting of two, three and four components.