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Rapid quantiative analysis of some rare earth oxides in inorganic glasses by means of energy dispersive X‐ray measurement in a scanning electron microscope
Author(s) -
Blum F.,
Res M. A.
Publication year - 1975
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300040203
Subject(s) - scanning electron microscope , ytterbium , materials science , neodymium , analytical chemistry (journal) , erbium , silicate , boron , x ray , calibration , rare earth , optics , mineralogy , doping , chemistry , laser , physics , optoelectronics , metallurgy , composite material , organic chemistry , chromatography , quantum mechanics
Abstract This paper deals with the quantitative analysis of neodymium, erbium and ytterbium oxides in borate, silicate and tellurite glasses by means of energy dispersive X‐ray analysis in a scanning electron microscope. The problem of the deconvolution of overlapping intensity peaks is discussed and calibration curves for rare earth oxides in the different base glasses are established.