Rapid quantiative analysis of some rare earth oxides in inorganic glasses by means of energy dispersive X‐ray measurement in a scanning electron microscope

This paper deals with the quantitative analysis of neodymium, erbium and ytterbium oxides in borate, silicate and tellurite glasses by means of energy dispersive X‐ray analysis in a scanning electron microscope. The problem of the deconvolution of overlapping intensity peaks is discussed and calibration curves for rare earth oxides in the different base glasses are established.