A new method for first order line interference correction in X‐ray spectrochemical analysis. Application to the analysis of geological samples | Zendy

Brändle J. L. | Zendy; Cerqueira M. I. | Zendy; Polonio J. B. | Zendy

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A new method for first order line interference correction in X‐ray spectrochemical analysis. Application to the analysis of geological samples

Author(s) -

Brändle J. L.,

Cerqueira M. I.,

Polonio J. B.

Publication year - 1974

Publication title -

x‐ray spectrometry

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.447

H-Index - 45

eISSN - 1097-4539

pISSN - 0049-8246

DOI - 10.1002/xrs.1300030309

Subject(s) - superposition principle , interference (communication) , position (finance) , intensity (physics) , line (geometry) , x ray , order (exchange) , sample (material) , physics , computational physics , optics , atomic physics , mathematical analysis , mathematics , geometry , computer science , thermodynamics , telecommunications , channel (broadcasting) , finance , economics

A mathematical procedure used for correcting the interference between two nearest first order overlapping lines is described. The intensity of the ‘composite’ peak is assumed to be a linear superposition of the individual components; the shift in angular position of the sample. The proposed method is based on the dependence existing between the different parameters involved, which can be represented by a mathematical relationship of the [R i ]=[k ij ] [C j ], where R i is the observed intensity, measured at the theoretical 2θ values for the elements involved, K ji are characteristic constants of the angular position and C j the concentration of the elements.

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