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The evaluation of the use of a scanning electron microscope combined with an energy dispersive X‐ray analyser for quantitative analysis
Author(s) -
Blum F.,
Brandt M. P.
Publication year - 1973
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300020306
Subject(s) - analyser , scanning electron microscope , detector , electron , electron microscope , materials science , interference (communication) , microscope , optics , analytical chemistry (journal) , energy (signal processing) , chemistry , physics , computer science , nuclear physics , chromatography , computer network , channel (broadcasting) , quantum mechanics
This paper describes an evaluation of the use of a scanning electron microscope to perform a rapid total analysis under secondary electron image conditions using a commercial energy dispersive X‐ray analyser. Problems encountered with overlapping intensity peaks and interference by the solid state Si (Li) detector are discussed. Elements heavier than sodium are detectable in metallic and geological samples and the total analysis of oxides requires only pure elements as standards.