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High intensity excitation sources for X‐ray energy spectroscopy
Author(s) -
Porter D. E.
Publication year - 1973
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300020208
Subject(s) - excitation , spectroscopy , intensity (physics) , materials science , atomic physics , analytical chemistry (journal) , chemistry , physics , optics , quantum mechanics , chromatography
The use of secondary targets with commercially available high power X‐ray spectroscopy tubes has been investigated as a means of providing an excitation source for X‐ray energy spectroscopy. A comparison has been made between the secondary target mode of excitation and the use of the tube directly. Results from this comparison show the superiority of the secondary target technique. Examples of analysis using the secondary target excitation are given to illustrate the high data rates and low background this technique has to offer.