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A simple calculation model with great versatility for interelement effects in steel by X‐ray fluorescence analysis
Author(s) -
Dahl M.,
Karlsson A.
Publication year - 1973
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300020207
Subject(s) - fluorescence , x ray fluorescence , spectrometer , binary number , simple (philosophy) , field (mathematics) , range (aeronautics) , absorption (acoustics) , analytical chemistry (journal) , boron , optics , computational physics , materials science , mineralogy , chemistry , physics , mathematics , nuclear physics , philosophy , arithmetic , epistemology , pure mathematics , composite material , chromatography
Demands of more rapid and accurate answers for the steel plant made it necessary to develop a computerized system for calculation and control of the analysis performed on X‐ray fluorescence and optical emission spectrometers. The interelement effects which occur in X‐ray fluorescence analysis are briefly described and the evolution of a model for these corrections is examined. This model includes corrections for absorption and secondary fluorescence as well as overlapping, dead time effects, etc. which are based on simplified theoretical formulae and can be used for a broad field of applications. The parameters in the model have been determined empirically by measuring a wide range of binary alloys. The interelement effects in optical emission analysis are calculated according to a simple emprical formula. The mathematical models have been fitted to a computer (Datasystem Trask P100) which also controls the two separate spectrometers. Examples are given of routine analysis performed by this model on bulk solids of steels and fused glassy borates of sinters, slags and hard metals. Its chief advantage is that the usual requirement for a great number of standards is eliminated.