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Adaptation of solid state detector in X‐Ray powder diffractometry
Author(s) -
Laine E.,
Lähteenmäki I.,
Kantola M.
Publication year - 1972
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300010304
Subject(s) - analyser , detector , diffraction , resolution (logic) , materials science , powder diffraction , x ray , radiation , optics , solid state , energy (signal processing) , x ray detector , semiconductor detector , x ray crystallography , analytical chemistry (journal) , semiconductor , physics , chemistry , optoelectronics , nuclear magnetic resonance , engineering physics , quantum mechanics , chromatography , artificial intelligence , computer science
Rapidly recorded X‐ray diffraction powder patterns from some metals and from rock salt have been obtained by using the energy sensitive Si (Li) semiconductor detector with the multichannel pulse height analyser. The measured energy resolution of the detector system was about 210 eV for Cu Kα radiation. A good agreement was obtained between observed and calculated positions and relative intensities of the diffraction lines.