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An element‐specific X‐ray fluorescence scanner for thin‐layer chromatograms
Author(s) -
Houpt P. M.
Publication year - 1972
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300010107
Subject(s) - x ray fluorescence , scanner , fluorescence , layer (electronics) , analytical chemistry (journal) , spectrometer , iodine , chlorine , thin layer , materials science , chemistry , optics , chromatography , nanotechnology , physics , metallurgy
An instrument is described which permits thin‐layer chromatograms to be scanned in a commercial X‐ray fluorescence spectrometer. The detection of phosphorus, sulphur, chlorine and iodine has been investigated, but the application of the instrument is not restricted to these elements, for which lower limits of detection of about 2 μg were found.