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Application of wavelength dispersive X‐ray spectroscopy to improve detection limits in X‐ray analysis
Author(s) -
Kavčič M.,
Žitnik M.,
Bučar K.,
Szlachetko J.
Publication year - 2011
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1291
Subject(s) - synchrotron radiation , spectrometer , detection limit , monochromatic color , excitation , synchrotron , x ray spectroscopy , spectral line , resolution (logic) , spectroscopy , scattering , analytical chemistry (journal) , chemistry , optics , atomic physics , physics , chromatography , astronomy , artificial intelligence , computer science , quantum mechanics
In this work, a Johansson‐type crystal spectrometer was employed to record the high‐resolution L X‐ray emission spectra of pure Ag, Pd and Cd target in order to determine minimum detection limits (MDL) for trace amounts of Pd and Cd in silver. The X‐ray emission was induced by a 3 MeV proton beam as well as by monochromatic synchrotron radiation with excitation energy tuned just below the Ag L 3 edge. As a direct consequence of extremely high spectrometer resolution reaching below the natural line widths of the measured L X‐ray lines, detection limits of a few tens of parts per million were reached in case of proton excitation. These limits were additionally lowered by an order of magnitude using energy‐selective photoexcitation with synchrotron radiation as the signal from the resonant Raman scattering (RRS) was completely separated from the Pd signal. The method presented in this work can be used in general to substantially improve detection limits in case of trace elements with atomic number in the close vicinity of the atomic number of the target matrix element. Copyright © 2011 John Wiley & Sons, Ltd.