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Effect of primary filter using theoretical intensity of fluorescent X‐rays and scattered X‐rays
Author(s) -
Ogawa R.,
Ochi H.,
Nishino M.,
Ichimaru N.,
Yamato R.
Publication year - 2010
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1284
Subject(s) - zirconium , intensity (physics) , filter (signal processing) , molybdenum , analytical chemistry (journal) , materials science , fluorescence , spectrometer , aluminium , titanium , brass , optics , chemistry , physics , copper , metallurgy , chromatography , computer science , computer vision
A primary filter is often used for low‐concentration analysis by energy‐dispersive X‐ray fluorescence spectrometer. We determined the material and thickness of the primary filter and calculated the theoretical intensities of the fluorescent X‐rays and scattered X‐rays using lead in brass, for which the concentration is known. The filter materials were zirconium, nickel, titanium, aluminum, and molybdenum with a thickness between 20 and 125 µm. For verification, we calculated the lower limits of detection using theoretical intensities for several filters and compared them with values calculated using the measured intensities. For example, both values were similar for a 125 µm zirconium filter: 128.0 ppm using theoretical intensities and 147.7 ppm using measured intensities. The theoretical intensity values are obtained by measurements and calculations, but require no primary filters for the measurements. This method is extremely effective for selecting the optimal filter for multiple samples and elements. Copyright © 2010 John Wiley & Sons, Ltd.