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Author(s) -
Sakurai Kenji
Publication year - 2010
Publication title -
x‐ray spectrometry
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1281
Subject(s) - optics , ptychography , phase contrast imaging , visibility , image quality , phase (matter) , diffraction , phase retrieval , projection (relational algebra) , physics , lens (geology) , computer science , materials science , phase contrast microscopy , artificial intelligence , image (mathematics) , algorithm , fourier transform , quantum mechanics
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