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X‐ray tracing study of crystal spectrometers for WDXRS application
Author(s) -
Tadić T.,
Jakšić M.,
Božičević I.
Publication year - 2009
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1155
Subject(s) - spectrometer , optics , ray tracing (physics) , wavelength , crystal (programming language) , resolution (logic) , line (geometry) , spectroscopy , x ray , physics , detector , x ray spectroscopy , materials science , computer science , geometry , mathematics , quantum mechanics , artificial intelligence , programming language
Construction of a high energy resolution crystal X‐ray spectrometer to be used for wavelength‐dispersive X‐ray emission spectroscopy (WDXRS) may result in different geometrical aberrations, such as systematic X‐ray line shifts and changes of the X‐ray line shape. Most of these aberrations can be reduced by careful design of a crystal spectrometer, keeping the efficiency of the spectrometer as high as possible. The availability of high‐resolution position‐sensitive detectors and small excitation beam sizes, and therefore a possible downsized Wavelength‐dispersive X‐ray (WDX) spectrometer, increase the need for reliable simulation of aberrations involved in WDXRS. Since the experimental investigation of the impact that WDX spectrometer design has on a particular aberration is rather time‐consuming, a numerical X‐ray tracing procedure, XTRACE, has been developed and applied for this purpose. Results are given in the form of virtual X‐ray energy spectra that have been affected by the most important aberrations. Copyright © 2009 John Wiley & Sons, Ltd.