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Trace element profiling of gunshot residues by PIXE and SEM‐EDS: a feasibility study
Author(s) -
Bailey M. J.,
Kirkby K. J.,
Jeynes C.
Publication year - 2009
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1142
Subject(s) - microprobe , scanning electron microscope , electron microprobe , trace element , materials science , analytical chemistry (journal) , energy dispersive x ray spectroscopy , radiochemistry , chemistry , mineralogy , environmental chemistry , metallurgy , composite material
A feasibility study was carried out into the use of particle‐induced x‐ray emission (PIXE) on the ion microprobe for the characterisation of gunshot residues (GSR). We compare these results with the conventional technique, scanning electron microscopy with energy dispersive x‐ray spectroscopy (SEM‐EDS). Samples of gunshot residue from four different sources were collected. Individual particles of GSR were analysed by SEM‐EDS using a 30‐keV electron beam focussed to ∼10 nm, and PIXE using a 2.5‐MeV proton beam focussed to ∼4 µm. PIXE revealed trace or minor elements undetectable by SEM‐EDS, thereby strengthening the discrimination between different types of GSR. Copyright © 2009 John Wiley & Sons, Ltd.