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Self‐enhancement effects on XRF K‐lines due to natural width
Author(s) -
Fernandez Jorge E.,
Scot Viviana
Publication year - 2009
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1137
Subject(s) - line width , line (geometry) , atom (system on chip) , distribution (mathematics) , energy (signal processing) , absorption (acoustics) , natural (archaeology) , atomic physics , full width at half maximum , physics , atomic number , condensed matter physics , computational physics , optics , mathematics , quantum mechanics , geometry , mathematical analysis , computer science , archaeology , history , embedded system
It is well known that the energy levels in the atom are defined within an energy width. Any electronic transition involving two or more levels shows a natural width given by the sum of the widths of the participating levels. Moreover, any XRF line appears to have a Lorentzian‐like distribution whose full width at half maximum is the natural width. Since the Lorentzian distribution has long tails on both sides, the tails may cross above neighbour absorption edges giving rise to enhancement effects of a certain complexity. In this article we discuss the self‐enhancement effects on XRF K‐lines in pure element samples having atomic numbers Z = 11–92. This study is performed with deterministic calculations. Copyright © 2009 John Wiley & Sons, Ltd.