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Improvement of spatial resolution of µ‐XRF by using a thin metal filter
Author(s) -
Nakano Kazuhiko,
Matsuda Akinori,
Nodera Yuta,
Tsuji Kouichi
Publication year - 2008
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1114
Subject(s) - optics , filter (signal processing) , image resolution , materials science , thin lens , lens (geology) , focal length , focal point , microbeam , resolution (logic) , beam (structure) , point (geometry) , foil method , spatial filter , physics , computer science , cardinal point , mathematics , composite material , geometry , artificial intelligence , computer vision
An improvement of spatial resolution of µ‐XRF by using a thin metal filter was investigated. The size of the x‐ray beam focused by the polycapillary x‐ray lens depended on the energy of the characteristic x‐rays. Original spot sizes at the focal point were 48 µm for CrKα, 41 µm for NiKα, and 28 µm for MoKα, respectively. To make the x‐ray beam size small, TiCu thin foil was placed between the output of the lens and the focal point as a metal filter to reduce the continuous x‐rays. Finally, the x‐ray microbeam size was improved to 30 µm by applying a filter. Clear 2D mapping images of Cr, Fe, and Ni in 300‐mesh stainless steel could be obtained by applying this filter. Copyright © 2008 John Wiley & Sons, Ltd.