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A survey of digital circuit testing in the light of machine learning
Author(s) -
Pradhan Manjari,
Bhattacharya Bhargab B.
Publication year - 2020
Publication title -
wiley interdisciplinary reviews: data mining and knowledge discovery
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.506
H-Index - 47
eISSN - 1942-4795
pISSN - 1942-4787
DOI - 10.1002/widm.1360
Subject(s) - computer science , context (archaeology) , domain (mathematical analysis) , dimension (graph theory) , digital electronics , process (computing) , integrated circuit , test (biology) , data science , artificial intelligence , machine learning , computer engineering , computer architecture , software engineering , electronic circuit , engineering , electrical engineering , mathematical analysis , paleontology , mathematics , pure mathematics , biology , operating system
The insistent trend in today's nanoscale technology, to keep abreast of the Moore's law, has been continually opening up newer challenges to circuit designers. With rapid downscaling of integration, the intricacies involved in the manufacturing process have escalated significantly. Concomitantly, the nature of defects in silicon chips has become more complex and unpredictable, adding further difficulty in circuit testing and diagnosis. The volume of test data has surged and the parameters that govern testing of integrated circuits have increased not only in dimension but also in the complexity of their correlation. Evidently, the current scenario serves as a pertinent platform to explore new test solutions based on machine learning. In this survey, we look at various recent advances in this evolving domain in the context of digital logic testing and diagnosis. This article is categorized under: Algorithmic Development > Structure Discovery Technologies > Machine Learning Technologies > Prediction