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Practical experiences of using an interferometric thickness gauge in production of multilayered plastic films and coatings
Author(s) -
Törmälä Sauli
Publication year - 1990
Publication title -
journal of vinyl technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.295
H-Index - 35
eISSN - 1548-0585
pISSN - 0193-7197
DOI - 10.1002/vnl.730120204
Subject(s) - gauge (firearms) , interferometry , materials science , line (geometry) , layer (electronics) , production line , extrusion , composite material , optics , computer science , mechanical engineering , engineering , physics , mathematics , metallurgy , geometry
Measuring and controlling layer thickness in co‐extrusion is difficult. In addition, an acceptable method for on‐line measurement of all separate layers does not presently exist. The method detailed in this report, although not applicable to on‐line measurement, is automatic, quick, and commercially available. The layer gauge method alone or together with on‐line total thickness gauges provides a useful arrangement to control the optimal thickness profiles.