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Application of SPC techniques to laboratory analysis
Author(s) -
McNeese W. H.,
Fenton J. T.
Publication year - 1987
Publication title -
journal of vinyl technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.295
H-Index - 35
eISSN - 1548-0585
pISSN - 0193-7197
DOI - 10.1002/vnl.730090307
Subject(s) - statistical process control , computer science , process (computing) , accuracy and precision , control chart , reliability engineering , engineering , statistics , mathematics , operating system
Efforts aimed at improving or monitoring quality must be based on measurement systems that are accurate and precise. The accuracy and precision of measurement systems can be controlled by the use of statistical methods, in particular by the use of control charts. A procedure has been proposed that involves determining the stability and precision of a measurement system. Comparison of the precision with overall process variability allows the processor to decide whether the measurement is adequate for monitoring the process.