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Fourier transform infrared micro spectroscopy mapping. Applications to the vinyl siding industry
Author(s) -
Garcia Dana,
Black Janine
Publication year - 1997
Publication title -
journal of vinyl and additive technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.295
H-Index - 35
eISSN - 1548-0585
pISSN - 1083-5601
DOI - 10.1002/vnl.10191
Subject(s) - fourier transform infrared spectroscopy , spectroscopy , materials science , fourier transform , infrared , infrared spectroscopy , fourier transform spectroscopy , focus (optics) , sample (material) , resolution (logic) , substrate (aquarium) , near infrared spectroscopy , analytical chemistry (journal) , optics , image resolution , remote sensing , computer science , chemistry , artificial intelligence , physics , geology , organic chemistry , chromatography , oceanography , quantum mechanics
Fourier transform infrared (FT‐IR) micro spectroscopy is a powerful analytical technique capable of yielding high quality information with a spatial resolution as low as 10 microns. When coupled with an automated mapping stage it can offer unique evaluation capabilities. This paper describes a number of applications of FT‐IR micro spectroscopy mapping to the vinyl siding industry. Examples will focus on determining, in single sample mapping experiments, the compositional changes associated with capstock to substrate transition and evaluating the degradation species and level observed during weathering exposure throughout the thickness of the siding panel.