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Oberflächenanalyse Teil 2: AES, XPS und SIMS Verfahren
Author(s) -
Jitschin W.,
Péus M.
Publication year - 1991
Publication title -
vakuum in forschung und praxis
Language(s) - German
Resource type - Journals
SCImago Journal Rank - 0.213
H-Index - 13
eISSN - 1522-2454
pISSN - 0947-076X
DOI - 10.1002/vipr.2230030211
Subject(s) - x ray photoelectron spectroscopy , physics , analytical chemistry (journal) , library science , chemistry , computer science , nuclear magnetic resonance , environmental chemistry