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Life Prediction of Residual Current Device Based on Wiener Process with GM (1, 1) Model
Author(s) -
Liu Guojin,
Wang Ze,
Li Xiang,
Yue Chenghao,
Li Wenhua
Publication year - 2021
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.23414
Subject(s) - residual , degradation (telecommunications) , reliability engineering , residual stress , wiener process , acceleration , process (computing) , computer science , engineering , current (fluid) , materials science , electronic engineering , electrical engineering , algorithm , mathematics , statistics , physics , classical mechanics , composite material , operating system
Residual current device (RCD), the critical equipment to protect the safety of electrical users, are known to experience performance degrade over time during their use lifetime. Therefore, in order to promptly replace the RCD before failure, it is very important to predict its lifetime. In order to predict the remaining life of the RCD, a constant‐stress accelerated degradation test (CSADT) and a combination prediction model are proposed. First, the CSADT is conducted with temperature as the acceleration stress and the residual operating current as degradation characteristic. Then, based on the prediction result of pseudo failure life, a combination model of Wiener process and GM (1, 1) model is given. Finally, the remaining life of the RCD under normal use environment is extrapolated. © 2021 Institute of Electrical Engineers of Japan. Published by Wiley Periodicals LLC.