z-logo
Premium
Measurements of nitrogen atom density in a microwave‐excited plasma jet produced under moderate pressures
Author(s) -
Kim Jaeho,
Takeda Keigo,
Itagaki Hirotomo,
Wang Xuelun,
Hirose Shingo,
Ogiso Hisato,
Shimizu Tetsuji,
Kumagai Naoto,
Tsutsumi Takayoshi,
Kondo Hiroki,
Hori Masaru,
Sakakita Hajime
Publication year - 2020
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.23194
Subject(s) - plasma , excited state , microwave , atomic physics , jet (fluid) , ion source , nitrogen , materials science , absorption (acoustics) , atom (system on chip) , chemistry , physics , organic chemistry , quantum mechanics , embedded system , computer science , composite material , thermodynamics
Using a microwave‐excited plasma source based on a microstrip line, we have generated a nitrogen plasma jet at a moderate pressure in the range from 1 to 10 kPa. The densities of nitrogen (N) atoms produced by the plasma jet were measured with a vacuum ultraviolet absorption spectroscopy. The results show that the plasma jet is able to provide a high density of N atoms at least 4.5 × 10 14  cm −3 at 1.5 kPa. The N atom densities vary widely with the change in gas flow rate and substrate placement. We expect that this plasma source will provide a high performance as an advanced N radical source in various applications. © 2020 Institute of Electrical Engineers of Japan. Published by Wiley Periodicals LLC.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom