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Recognition method of voltage sag causes based on Bi‐LSTM
Author(s) -
Zheng Zhicong,
Qi Linhai,
Wang Hong,
Zhu Manting,
Chen Qian
Publication year - 2020
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.23070
Subject(s) - voltage sag , softmax function , computer science , artificial intelligence , adaptability , feature extraction , electric power system , pattern recognition (psychology) , time domain , data mining , deep learning , power (physics) , voltage , engineering , power quality , electrical engineering , ecology , physics , quantum mechanics , biology , computer vision
In recent years, the power quality problem has become more complicated in power grids because of the extensive usage of power electronics and multisource multitransformation features. The method, based on physical characteristics such as time domain, frequency domain and transform domain, is facing challenges in terms of adaptability, algorithm efficiency and accuracy for the recognition of complex disturbance recognition. The bidirectional long short‐term memory network is an algorithm in deep learning. It is based on data for characterization learning, which can effectively overcome the problem of information loss and generalization ability of physical methods. Moreover, it has the characteristics of memory, which can simultaneously consider historical information and future information and can better learn data features with time series characteristics. Aiming at the transient voltage sag time series data, this paper proposes a recognition method of the voltage sag causes based on the bidirectional long short‐term memory network's extraction eigenvalue, the full‐connection layer's high‐dimensional feature extraction and the Softmax network layer's classification. The experiment uses simulation data and measured data to prove that the model has good recognition ability and good antinoise performance in the recognition of voltage sag causes and can be reliably applied in practical engineering. © 2019 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.