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Selective‐tripping scheme for power supply arm on high‐speed railway based on correlation analysis between feeder current fault components in multisite
Author(s) -
Lin Guosong,
Gao Shibin
Publication year - 2019
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.22864
Subject(s) - tripping , circuit breaker , busbar , fault (geology) , electrical engineering , engineering , traction substation , traction (geology) , transformer , line (geometry) , voltage , automotive engineering , mathematics , mechanical engineering , geometry , seismology , geology
Auto‐transformer (AT) power traction networks with a parallel connection are the unique mode on high‐speed electric railways in China. The up line and down line of power traction networks are connected at substation (SS), AT post (ATP) and sectioning post (SP) through busbars, circuit breakers and disconnectors. Currently, when a fault occurs on power traction networks, the feeder line protection devices at the up line and down line in SS trip simultaneously. After that, the nonfault line and instantaneous fault line recover by means of autoreclosing. This tripping mode enlarges the power supply‐interrupted region. Based on the analysis of circuit networks of power traction networks on high‐speed electric railways, the interrelations of currents in SS and ATP and in SS and SP are derived. When a fault occurs on one side of the power traction networks, the feeder currents in ATP and SP flow from the nonfault side to the fault side. The relation between feeder currents in SS and ATP and between feeder currents in SS and SP reflect this characteristic. A criterion for discriminating the fault side and selective‐tripping scheme of breakers is proposed based on the correlation analysis of feeder current fault components in multisite. The simulation results show that this scheme can discriminate fault side and make a selective trip rapidly and correctly. © 2019 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.