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Water quality analysis in Lake Hachiroko, Japan, using ALOS AVNIR‐2 data
Author(s) -
Wang Dejian,
Kageyama Yoichi,
Nishida Makoto,
Shirai Hikaru,
Motozawa Asana
Publication year - 2013
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.21906
Subject(s) - remote sensing , synthetic aperture radar , thematic mapper , environmental science , water quality , satellite , radiometer , image resolution , thematic map , computer science , satellite imagery , geology , geography , cartography , engineering , ecology , aerospace engineering , artificial intelligence , biology
In recent years, remote sensing has been used to assessing water pollution distribution. In this study, water quality is analyzed using data collected by the Advanced Visible and Near Infrared Radiometer type‐2 (AVNIR‐2) of the Advanced Land Observing Satellite (ALOS) at various points in time. We carried out fuzzy regression analysis of the AVNIR‐2 data and direct measurements of local water quality. The relationship between the water quality data and the AVNIR‐2 data was analyzed by solving both the min and max problems. By comparing the maps of estimated water quality with actual distributions of water quality in the study area, we found that the method used in this study allows effective derivation of water quality conditions from AVNIR‐2 data, which provides 10‐m spatial resolution. Furthermore, by comparing the maps created using AVNIR‐2 data collected at different times, we obtained results suggesting temporal changes in water quality. We also compared the results obtained using data collected by the optical sensor of the Landsat thematic mapper (TM) with 30‐m resolution and those obtained using data collected by the active sensor of JERS‐1 synthetic aperture radar (SAR), and examined the differences in classification results resulting from differences in resolution and sensors. © 2013 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.