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Self‐calibrated SAR ADC based on split capacitor DAC without the use of fractional‐value capacitor
Author(s) -
Du Ling,
Ning Ning,
Zhang Jun,
Yu Qi,
Liu Yang
Publication year - 2013
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.21872
Subject(s) - capacitor , successive approximation adc , value (mathematics) , materials science , electronic engineering , electrical engineering , voltage , mathematics , engineering , statistics
A successive approximation register analog‐to‐digital converter (SAR ADC) based on a split‐capacitor digital‐to‐analog converter (CDAC) with a split binary weighted capacitor array and C‐2C ladder is proposed. In present design, a unit split capacitor is used in the CDAC instead of the fractional‐value capacitor in the conventional configuration. The preset error induced by the unit split capacitor and the mismatch error of the upper bit CDAC are self‐calibrated. The calibration range and the impact of calibration DAC resolution on circuit linearity are studied to provide an optimum design guideline. Behavior simulation and post‐layout simulation are performed to verify the proposed calibration method. © 2013 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.