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Measurement of space charge distributions in PLZT using Kerr effect
Author(s) -
Wong Kiing Ing
Publication year - 2012
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.21757
Subject(s) - electric field , dielectric , space charge , materials science , stress (linguistics) , charge (physics) , zirconium , voltage , condensed matter physics , field (mathematics) , electrical engineering , optoelectronics , physics , metallurgy , engineering , linguistics , philosophy , mathematics , quantum mechanics , pure mathematics , electron
Kerr effect technique is an optical measurement technique used to determine space charge distributions of a dielectric liquid under applied electric stress. In other words, such measurement can be used to study the conduction mechanisms of a dielectric liquid, such as charge injection threshold, bulk electric field stress, and aging. In this study, an instrument was set up to measure the absolute value of the electric field distributions in lead–lanthanum–zirconium–titanium (PLZT). PLZT was selected for the study of the instrumentation because the material has a high Kerr constant. In the experiment, charge injection threshold and bulk field strength of PLZT were measured under low applied voltages. © 2012 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.