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Production Test Considerations for Mixed‐signal IC with Background Calibration
Author(s) -
Yagi Takuya,
Kobayashi Haruo,
Tan Yohei,
Ito Satoshi,
Uemori Satoshi,
Takai Nobukazu,
Yamaguchi Takahiro J.
Publication year - 2010
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.20584
Subject(s) - calibration , convergence (economics) , computer science , signal (programming language) , reliability engineering , electronic engineering , engineering , mathematics , statistics , economics , programming language , economic growth
This paper proposes an improved method of background calibration that reduces the production testing time of mixed‐signal ICs. Production testing time typically consists of ‘calibration convergence time’ and ‘functional testing time’ following calibration convergence. The method of reducing calibration convergence time that is proposed here does not require an extra ADC operation for functional testing after calibration convergence, and can be implemented with a little additional on‐chip test‐support circuitry when testing is performed by an automatic test equipment (ATE). We discuss the application of this method to background calibration of pipelined ADCs, and present simulation results that demonstrate its effectiveness in reducing testing time. Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.