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Advanced Scanning Probes for Micro–Nano Science Researches
Author(s) -
Akiyama Terunobu,
Gautsch Sebastian,
Parrat Daniel,
Imer Raphaël,
Vettiger Peter,
Staufer Urs,
de Rooij Nicolaas F.
Publication year - 2010
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.20527
Subject(s) - nanotechnology , nano , deflection (physics) , atomic force microscopy , engineering , scanning probe microscopy , materials science , computer science , optics , physics , chemical engineering
In this study, we introduce five unique scanning probes developed in our laboratory for different fields of application. These probes are the results of excellent collaborations with many external partners. Each probe possesses many advanced features that one can hardly obtain with plane probes for conventional optical deflection system. The applications of these probes are very versatile, from atomic force microscope for the exploration of Mars to in vivo measurements of human knee cartilage. Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.