Premium
Generation of CNTs on STM Probes Using the Simple Arc Discharge Method
Author(s) -
Kim Yuichi,
Nishikawa Eiichi,
Kioka Toshihide
Publication year - 2009
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.20447
Subject(s) - carbon nanotube , electric arc , materials science , scanning tunneling microscope , field electron emission , nanotechnology , scanning electron microscope , electrode , electric discharge , optoelectronics , electron , chemistry , composite material , physics , quantum mechanics
We succeeded in producing carbon nanotubes (CNTs) on scanning tunneling microscope (STM) probes using the simple arc discharge method. We used STM probes with a diameter of 200 µm (500 nm in diameter at the tip), and placed them in a position 5 mm from a set of carbon electrodes between which a direct current discharge of 30 V/20 A was applied. The results of scanning electron microscopy observation confirmed that the fine particles generated included high‐purity CNTs on the STM probe surface. Specifically, CNTs were generated directly on the surface of the STM probe. This study indicates that the technique is suitable for nano‐analysis application in the field of nanotechnology. © 2009 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.