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Statistical analysis related to impulse tests for self‐restoring insulation
Author(s) -
Komori Yoshio
Publication year - 2008
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.20330
Subject(s) - impulse (physics) , statistical analysis , standard deviation , independence (probability theory) , voltage , maximum likelihood , statistics , engineering , computer science , mathematics , reliability engineering , electrical engineering , physics , quantum mechanics
For dielectric tests with impulse voltage, some statistical methods with the step‐up procedure have been recently proposed. In the present paper, the methods are reconsidered from the viewpoint of statistical independence concerning disruptive discharges. As a result, modified methods with the step‐up procedure or with the up‐and‐down procedure are proposed for self‐restoring insulation, and it is shown that they have good properties in the maximum likelihood estimation for the mean and the standard deviation of a normal distribution. Copyright © 2008 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.