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Recent developments on high current measurement using current shunt
Author(s) -
Kawamura Tatsuo,
Haginomori Eiichi,
Goda Yutaka,
Nakamoto Tetsuya
Publication year - 2007
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.20203
Subject(s) - traceability , current (fluid) , electrical engineering , engineering , reliability engineering , computer science , systems engineering , software engineering
Abstract The Short‐circuit Testing Liaison (STL) is the organization that consists of high power testing laboratories of the world. Member laboratories perform short‐circuit tests under uniform interpretations of the IEC standards agreed through technical discussions and information exchanges among them. One of the recent projects that the STL has been working on is to establish uncertainty and traceability of high current measurement by international comparison tests with reference shunts. In concert with this project, the IEC Working Group is preparing the new standard for high current measurements. Copyright © 2007 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.