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In situ visualization of degradation of silicon field emitter tips
Author(s) -
Nozawa Naoyuki,
Kakushima Kuniyuki,
Hashiguchi Gen,
Fujita Hiroyuki
Publication year - 2007
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.20166
Subject(s) - fujita scale , computer science , library science , world wide web , engineering , computer graphics (images) , physics , meteorology
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