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Process variation compensation technique for voltage‐controlled ring oscillator
Author(s) -
Kim Guechol,
Ueda Keisuke,
Cha Sungwoo,
Ida Tsukasa,
Shimizu Yoshiyuki,
Matsuoka Toshimasa,
Taniguchi Kenji
Publication year - 2007
Publication title -
ieej transactions on electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 30
eISSN - 1931-4981
pISSN - 1931-4973
DOI - 10.1002/tee.20125
Subject(s) - ring oscillator , ring (chemistry) , voltage controlled oscillator , compensation (psychology) , delay line oscillator , vackář oscillator , voltage , digitally controlled oscillator , electrical engineering , cmos , variable frequency oscillator , process variation , electronic engineering , process (computing) , frequency drift , computer science , engineering , chemistry , psychology , organic chemistry , psychoanalysis , operating system
A voltage‐controlled ring oscillator with process variation compensation circuits is designed using 0.25 µm CMOS technology. The simulation results show that the proposed ring oscillator increases the guaranteed frequency tuning range by 12% compared to a conventional ring oscillator. Copyright © 2007 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.