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Far‐ and Deep‐Ultraviolet Surface Plasmon Resonance Sensor
Author(s) -
Tanabe Ichiro,
Tanaka Yoshito Y.
Publication year - 2019
Publication title -
the chemical record
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.61
H-Index - 78
eISSN - 1528-0691
pISSN - 1527-8999
DOI - 10.1002/tcr.201800078
Subject(s) - surface plasmon resonance , plasmon , materials science , refractive index , ultraviolet , optoelectronics , wavelength , selectivity , surface plasmon , resonance (particle physics) , optics , reflectivity , nanotechnology , chemistry , physics , nanoparticle , atomic physics , biochemistry , catalysis
Plasmonics in the UV region has been widely focused because of the higher energy and the abundant electronic resonances compared to the conventional visible plasmonics. Recently, we have investigated the surface plasmon resonance (SPR) properties of the Al film, aiming for the application as refractive index sensors. Utilizing the UV lights, we expect three advantages: high sensitivity, material selectivity, and surface selectivity. By using an original attenuated total reflectance spectroscopic instrument, Al‐SPR angle and wavelength were investigated with changing environments on the Al film. Al film thickness and materials of prisms on which Al was evaporated were also important factors for the SPR properties. By optimizing the conditions, the Al film worked as a sensor both in air and in liquids. In addition, our established system expands the plasmonics into an even higher energy region than 200 nm, while the UV‐plasmonics have been studied in the wavelength region longer than 200 nm.