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Local Analyses of Ionic Liquid/Solid Interfaces by Frequency Modulation Atomic Force Microscopy and Photoemission Spectroscopy
Author(s) -
Fukui Kenichi,
Yokota Yasuyuki,
Imanishi Akihito
Publication year - 2014
Publication title -
the chemical record
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.61
H-Index - 78
eISSN - 1528-0691
pISSN - 1527-8999
DOI - 10.1002/tcr.201402032
Subject(s) - materials science , ionic liquid , electrochemistry , electrode , ion , layer (electronics) , analytical chemistry (journal) , chemical physics , modulation (music) , atomic force microscopy , ionic bonding , spectroscopy , nanotechnology , chemistry , biochemistry , philosophy , physics , organic chemistry , chromatography , aesthetics , quantum mechanics , catalysis
Local analyses of ionic liquid/solid electrode interfaces at a controlled electrode potential are of fundamental importance to understanding the origin and properties of the electric double layer at the interfaces, which is necessary for their application to electrochemical devices. This account summarizes our recent achievements of such analyses by using the novel analytical tools of electrochemical frequency modulation AFM ( EC‐FM‐AFM ) and electrochemical photoemission spectroscopy ( EC‐PES ). Rather stable stepped structures composed of layers of ion pairs and softer solvation layers outside of the imaged layer were clearly visualized by FM‐AFM depending on the substrates. An extremely extended diffusion layer was directly observed by EC‐PES during the electrodeposition of metal ion solutes.